If you are experiencing problems downloading PDF or HTML fulltext, our helpdesk recommend clearing your browser cache and trying again. If you need help in clearing your cache, please click here . Still need help? Email help@ingentaconnect.com

Publisher: Taylor and Francis Ltd

More about this publication?
Related content
Volume 82, Number 3, 1 February 2002

< previous issue | all issues | next issue >

Favourites:Add to Favourites

Numerical modelling of martensitic growth in an elastoplastic material
pp. 429-462(34)
Authors: Levitas, Valery I.; Idesman, Alexander V.; Olson, Gregory B.; Stein, Erwin

Favourites:Add to Favourites

Thermodynamics of constitutional and thermal point defects in B2 Ni1-x Alx
pp. 479-496(18)
Authors: Breuer, J.; Sommer, F.; Mittemeijer, E. J.

Favourites:Add to Favourites

New type of precipitate in Mg–rare-earth alloys
pp. 497-510(14)
Authors: Hisa, Masaaki; Barry, John C.; Dunlop, Gordon L.

Favourites:Add to Favourites

A change in the chemical bonding strength and high-temperature creep resistance in Al2O3 with lanthanoid oxide doping
pp. 511-525(15)
Authors: Yoshida, H.; Yamamoto, T.; Ikuhara, Y.; Sakuma, T.

Favourites:Add to Favourites

Ageing of two-dimensional clusters of bubbles
pp. 527-539(13)
Authors: Fortes, M. A.; Rosa, M. Emília; Afonso, L.

Favourites:Add to Favourites

Planar faults in Aurivillius compounds: an X-ray diffraction study
pp. 615-632(18)
Authors: Boulle, A.; Legrand, C.; Guinebretiè, R.; Mercurio, J. P.; Dauger, A.

Favourites:Add to Favourites

Delamination of metal thin films on polymer substrates: from straight-sided blisters to varicose structures
pp. 633-641(9)
Authors: George, M.; Coupeau, C.; Colin, J.; Cleymand, F.; Grilhé, J.

Share Content

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more