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Philosophical Magazine A is now published as Philosophical Magazine.

Publisher: Taylor and Francis Ltd

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Volume 81, Number 5, 1 May 2001

Dr Michael S. Duesbery: an appreciation
pp. 1021-1022(2)
Author: Hirsch, P. B.

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Microporous fine-grained copper: structure and properties
pp. 1023-1040(18)
Authors: Kumar, K. S.; Duesbery, M. S.; Louat, N. P.; Provenzano, V.; Dipietro, M. S.

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Climb/glide dislocation sources at low-misfit Gex Si1-x -Si(001) interfaces
pp. 1041-1064(24)
Authors: Jiao, S.; Hirsch, P. B.; Perovic, D. D.

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Cross-slip of superpartial dislocations in iron aluminides
pp. 1065-1077(13)
Author: Paidar, V.

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Stacking-fault energy and yield stress asymmetry in molybdenum disilicide
pp. 1079-1097(19)
Authors: Mitchell, T. E.; Baskes, M. I.; Chen, S. P.; Hirth, J. P.; Hoagland, R. G.

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Temperature rise due to fast-moving dislocations
pp. 1099-1120(22)
Authors: De Hosson, J. Th. M.; Roos, A.; Metselaar, E. D.

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Deformation of copper single crystals to large strains at 4.2K - I. Mechanical response and electrical resistivity
pp. 1121-1142(22)
Authors: Niewczas, M. M; Basinski, Z. S.; Basinski, S. J.; Embury, J. D.

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On transition temperatures in the plasticity and fracture of semiconductors
pp. 1207-1227(21)
Authors: Pirouz, P.; Demenet, J. L.; Hong, M. H.

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Stochastic analysis of two-dimensional grain growth
pp. 1229-1239(11)
Authors: Pande, C. S.; Masumura, R. A.; Marsh, S. P.

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Multiple-dislocation emission from the crack tip in the ductile fracture of Al
pp. 1241-1255(15)
Authors: Farkas, D.; Duranduru, M.; Curtin, W. A.; Ribbens, C.

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Parameter-free modelling of dislocation motion: the case of silicon
pp. 1257-1281(25)
Authors: Bulatov, V. V.; Justo, J. F.; Cai, Wei; Yip, Sidney; Argon, A. S.; Lenosky, T.; Dekoning, M.; Diaz de la Rubia, T.

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Role of crack tip plasticity in fatigue crack growth
pp. 1283-1303(21)
Authors: Sadanandaa, K.; Ramaswamy, Dorai-Nirmal V.

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Ab-initio simulation of isolated screw dislocations in bcc Mo and Ta
pp. 1305-1316(12)
Authors: Woodward, C.; Rao, S. I.

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The Peierls-Nabarro model and the mobility of the dislocation line
pp. 1329-1340(12)
Authors: Joos, B.; Zhou, J.

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Towards thermodynamics of elastic electric conductors
pp. 1341-1354(14)
Authors: Grinfeld, Michael; Grinfeld, Pavel

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Accurate atomistic simulation of (a/2) <111> screw dislocations and other defects in bcc tantalum
pp. 1355-1385(31)
Authors: Yang, L. H.; Soderlind, Per; Moriarty, John

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Thermal activation under shear
pp. 1409-1426(18)
Authors: Cahn, J. W.; Nabarro, F. R. N.

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