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Publisher: Taylor and Francis Ltd

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Volume 80, Number 7, 1 July 2000

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Tracer correlation factors in the random alloy
pp. 1469-1479(11)
Authors: Belova, I. V.; Murch, G. E.

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Microstructural study of long-range-ordered phase delta'-TiN 0.5 by transmission electron microscopy
pp. 1495-1505(11)
Authors: Yang, G. Y.; Etchessahar, E.; Portier, R.; Debuigne, J.

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On the strengthening of Ni3Al by hafnium additions
pp. 1545-1566(22)
Authors: Kruml, T.; Martin, J. L.; Bonneville, J.

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Geometry and electronic structure of [0001]/(1230) Σ = 7 symmetric tilt boundary in ZnO
pp. 1567-1581(15)
Authors: Oba, Fumiyasu; Tanaka, Isao; Nishitani, Shigeto R.; Adachi, Hirohiko; Slater, Ben; Gay, David H.

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Atomic site occupancy in D022 and L12 titanium trialuminides
pp. 1583-1603(21)
Authors: Rossouw, C. J.; Forwood, C. T.; Gibson, M. A.

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Specific dislocation multiplication mechanisms and mechanical properties in nanoscaled multilayers: the example of pearlite
pp. 1605-1619(15)
Authors: Janecek, M.; Louchet, F.; Doisneau-Cottignies, B.; Bréchet, Y.; Guelton, N.

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CdTe-Cd: a new semiconductor with polytype structure
pp. 1621-1628(8)
Authors: Picos-Vega, A.; Ramírez-Bon, R.; Espinoza-Beltrán, F. J.; Zelaya-Angel, O.; González-Hernández, J.; Chao, B.

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Electron microscopy study of scratch-induced surface microstructures in an Al-Cu-Fe icosahedral quasicrystal
pp. 1645-1655(11)
Authors: Wu, J. S; Brien, V.; Brunet, P.; Dong, C.; Dubois, J. M.

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Numerical simulation of dislocation motion in three-dimensional icosahedral quasicrystals
pp. 1657-1668(12)
Authors: Schaaf, G. D.; Roth, J.; Trebin, H.-R.; Mikulla, R.

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Interfacial wetting and percolation threshold in ultrathin Ni/C multilayer films
pp. 1669-1679(11)
Authors: Borchers, C.; Ricardo, P.; Michaelsen, C.

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Measurement of the Cosserat constant of circular-cell polycarbonate honeycomb
pp. 1699-1713(15)
Authors: Mora, Rafael; Waas, Anthony M.

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