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Publisher: Taylor and Francis Ltd

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Volume 80, Number 4, 1 April 2000

Ordinary dislocations in gamma-TiAl: cusp unzipping, jog dragging and stress anomaly
pp. 765-779(15)
Authors: Louchet, Francois; Viguier, Bernard

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Atomic-scale observation and modelling of cementite dissolution in heavily deformed pearlitic steels
pp. 781-796(16)
Authors: Sauvage, X.; Copreaux, J.; Danoix, F.; Blavette, D.

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Combined Monte Carlo-energy minimization analysis of Al-Fe disorder in Ca2FeAlO5 brownmillerite
pp. 797-807(11)
Authors: Zacate, Matthew O.; Grimes, Robin W.

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Kikuchi bands in quasicrystals and their approximants
pp. 843-852(10)
Authors: Gibbons, P. C.; Kelton, K. F.; Ranganathan, S.; Daulton, T. L.

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First-principles calculation of stacking fault and twin boundary energies of Cr2Nb
pp. 871-880(10)
Authors: Hong, Suklyun; Fu, C. L.; Yoo, M. H.

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Twist-type silicon bicrystals and compliant substrates prepared from silicon-on-insulator wafers
pp. 881-891(11)
Authors: Chen, Chih; Tu, K. N.; Tung, C. H.; Sheng, T. T.; Ploessl, A.; Scholz, R.; Gosele, U.

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Irradiation induced defects in deformed Ni3Ge and Ni3Al single crystals
pp. 893-918(26)
Authors: Murakumo, T.; Ueta, S.; Miyahara, A.; Hannuki, T.; Sato, A.

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Stacking fault energy of 6H-SiC and 4H-SiC single crystals
pp. 919-935(17)
Authors: Hong, M. H.; Samant, A. V.; Pirouz, P.

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Growth defects in GaN layers on top of (0001) sapphire: a geometrical investigation of the misfit effect
pp. 937-954(18)
Authors: Ruterana, P.; Potin, V.; Barbaray, B.; Nouet, G.

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Stress-strain curves of sputter-deposited Ti-Ni thin films
pp. 967-980(14)
Authors: Ishida, A.; Sato, M.; Kimura, T.; Miyazaki, S.

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Coarsening of two- and three-dimensional wet polydisperse foams
pp. 981-1000(20)
Authors: Gardiner, B. S.; Dlugogorski, B. Z.; Jameson, G. J.

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The influence of fast secondary electrons on the aromatic structure of polystyrene
pp. 1001-1016(16)
Authors: Siangchaew, K.; Libera, M.

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Microsample tensile testing of nanocrystalline metals
pp. 1017-1026(10)
Authors: Legros, M.; Elliott, B. R.; Rittner, M. N.; Weertman, J. R.; Hemker, K. J.

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