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Philosophical Magazine A is now published as Philosophical Magazine.

Publisher: Taylor and Francis Ltd

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Volume 79, Number 5, 1 May 1999

First direct evidence of size-dependent structural transition in nanosized nickel particles
pp. 1021-1031(11)
Authors: Illy, S.; Tillement, O.; Machizaud, F.; Dubois, J. M.; Massicot, F.; Fort, Y.; Ghanbaja, J.

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Nanoscopic crystallography of chalcopyrite CuInS2 by techniques of convergent-beam electron diffraction
pp. 1033-1043(11)
Authors: Leicht, M.; Stenkamp, D.; Strunk, H. P.; Wolf, D.; Eisner, B.; Muller, G.

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Dislocation processes during the plastic deformation of gamma-TiAl
pp. 1045-1071(27)
Authors: Haussler, D.; Bartsch, M.; Aindow, M.; Jones, I. P.; Messerschmidt, U.

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Dislocation structurein aTi-45at.% Al-10at.% Nballoy deformed at room temperature
pp. 1073-1078(6)
Authors: Zhang, W. J.; Liu, Z. C.; Chen, G. L.; Kim, Y.-W.

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Crystallization behaviour and nanocrystalline microstructure evolution of a Zr57Cu20Al10Ni8Ti5 bulk amorphous alloy
pp. 1095-1108(14)
Authors: Xing, L. Q.; Eckert, J.; Loser, W.; Schultz, L.; Herlach, D. M.

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A new probe of bonding states in intermetallic compounds
pp. 1109-1129(21)
Authors: Castle, J. E.; Greaves, S. J.; Guascito, M. R.; Salvi, A. M.

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Computer simulation of grain growth in dual-phase structures
pp. 1131-1144(14)
Authors: Ohnuma, Ikuo; Ishida, Kiyohito; Nishizawa, Taiji

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Lattice parameters, density and thermal expansion of InN microcrystals grown by the reaction of nitrogen plasma with liquid indium
pp. 1145-1154(10)
Authors: Paszkowicz, W.; Adamczyk, J.; Krukowski, S.; Leszczynski, M.; Porowski, S.

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Atomistic simulation of cross-slip processes in model fcc structures
pp. 1167-1192(26)
Authors: Rao, S.; Parthasarathy, T . A.; Woodward, C.

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A microstructural model for predicting hardness profiles of Fe-Cr alloys after nitriding
pp. 1193-1206(14)
Authors: Braam, J. J.; Zwaag, S. Van Der

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The dissociation energy of extended dislocations in fcc lattices
pp. 1207-1215(9)
Author: Schoeck, Gunther

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Interionic potential model for the Al-Li system
pp. 1233-1246(14)
Authors: Mikhin, A. G.; Dediego, N.

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