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Publisher: Taylor and Francis Ltd

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Volume 79, Number 2, 1 February 1999

Superlattice ordering of cubic symmetry in an icosahedral Al-Pd-Mn phase
pp. 255-270(16)
Authors: Audier, M.; Duneau, M.; Boissieu, M. De; Boudard, M.; Letoublon, A.

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Dislocation pinning in a low-dose neutron irradiated Al-Mg-Si industrial alloy
pp. 293-304(12)
Authors: Carreno-Morelli, E.; Ghilarducci, A. A.; Urreta, S. E.

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Grain-boundary plane reorientation in copper
pp. 305-316(12)
Authors: Randle, Valerie; Davies, Paul; Hulm, Belinda

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Dislocation migration and phason strain relaxation in a quasicrystal
pp. 317-327(11)
Authors: Takeuchi, S.; Shinoda, K.; Edagawa, K.

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Conditions for superplastic deformation
pp. 329-338(10)
Authors: Pshenichnyuk, A. I.; Kaibyshev, O. A.; Astanin, V. V.

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Interpretation of creep curves of double-notch copper single crystal specimens
pp. 339-348(10)
Authors: Orlova, Alena; Kucharova, Kveta

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Atomistic models of dislocation formation at crystal surface ledges in Si1-xGex/Si(100) heteroepitaxial thin films
pp. 349-370(22)
Authors: Gao, H.; Ozkan, C. S.; Nix, W. D.; Zimmerman, J. A.; Freund, L. B.

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Structural effects in ion-beam-modified polymers
pp. 391-401(11)
Authors: Gerstner, E. G.; Mcculloch, D. G.; Mckenzie, D. R.; Yap, E.

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Planar debris in plastically deformed Al-rich gamma-TiAl
pp. 403-421(19)
Authors: Gregori, Fabienne; Veyssiere, Patrick

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Nuclear magnetic resonance studies on Cu3Au, CuAu and CuAu3 alloys
pp. 437-448(12)
Authors: Shinohara, T.; Saitoh, S.; Wagatuma, F.; Yamaguchi, S.

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Hydrogen and water intercalation into YBa2Cu3O7-delta: structural properties of H2YBa2Cu3O8-delta
pp. 449-466(18)
Authors: Gunther, W.; Schollhorn, R.; Epple, M.; Siegle, H.; Thomsen, Ch.; Kabius, B.; Poppe, U.; Schubert, J.; Zander, W.

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Dynamical expansion of a dislocation loop on a two-dimensional periodic potential
pp. 467-484(18)
Authors: Koizumi, H.; Ohno, K.; Suzuki, T.; Nabarro, F. R. N.

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Hardness enhancement and elastic modulus behaviour in sputtered Ag/Ni multilayers with different modulation wavelengths
pp. 485-500(16)
Authors: Geisler, H.; Schweitz, K. O.; Chevallier, J.; Blttiger, J.; Samwer, K.

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