Transmission electron microscopy study of complex planar faults in Ru-Al-0.5 at.% B

Authors: Lu, D.-C.; De Graef, M.; Pollock, T. M.

Source: Philosophical Magazine, Volume 84, Number 22, August 1, 2004 , pp. 2317-2329(13)

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Abstract:

The structure of planar precipitates in boron-containing Ru-Al alloys is analysed by means of two-beam transmission electron microscopy methods. The precipitates are shown to be non-conservative substitutional complex faults arising from the substitution of aluminium by boron. The faults are located on {001} planes with displacement vector of the type with δ a small number. The crystallography of the planar faults is shown to be related to the crystallography of ternary borides of the type Al n −1 B 2 X n .

Document Type: Research article

DOI: http://dx.doi.org/10.1080/14786430410001678181

Affiliations: 1: Department of Materials Science and Engineering University of Michigan Ann Arbor Michigan 48109 USA

Publication date: 2004-08-01

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