Philosophical Magazine B

Preface
pp. 1629-1630(2)

Dr Alain Bourret
pp. 1631-1631(1)

Atomic structure and core composition of partial dislocations and dislocation fronts in -SiC by high-resolution transmission electron microscopy
pp. 1633-1647(15)
Authors: Lancin M.; Ragaru C.; Godon C.

Effect of the interface structure on the high-temperature morphology of supported metal clusters
pp. 1649-1658(10)
Authors: Graoui H.; Giorgio S.; Henry C. R.

Lattice defects in organic crystals revealed by direct molecular imaging
pp. 1659-1667(9)
Authors: Maeda T.; Kobayashi T.; Nemoto T.; Isoda S.

Transmission electron microscopy for research of new layered oxides: study of the Bi–Sr–Fe–O system
pp. 1669-1685(17)
Authors: Pelloquin D.; Allix M.; Michel C.; Hervieu M.; Raveau B.

Imaging point defects using a transmission electron microscope with controllable spherical aberration
pp. 1687-1699(13)
Author: Anstis G. R.

On the measurement of dislocation core periods by nanodiffraction
pp. 1701-1711(11)
Authors: Spence J. C. H.; Koch C.

Guinier–Preston zones observed by high-angle annular detector dark-field scanning transmission electron microscopy
pp. 1713-1724(12)
Authors: Konno T. J.; Kawasaki M.; Hiraga K.

Identification of interfacial layers in Ohmic contacts to n-type GaN and Al _x Ga_{1– x} N/GaN heterostructures using high-resolution electron microscopy
pp. 1725-1744(20)
Authors: Bright A. N.; Humphreys C. J.

Interfaces between lanthanum hexaaluminate and sapphire studied by high-resolution electron microscopy
pp. 1745-1765(21)
Authors: Wessler B.; Steinecker A.; Mader W.

Rigid-body displacement perpendicular to a {211} twin boundary in Mo
pp. 1767-1778(12)
Authors: Gemperlová J.; Vystavel T.; Gemperle A.; Pénisson J. M.

A geometrical study of single-walled nanotube ropes by transmission electron microscopy
pp. 1779-1799(21)
Authors: Hamon A-L.; Marraud A.; Jouffrey B.

Time-resolved electron microscopy studies of the structure of nanoparticles and their melting
pp. 1801-1819(19)
Authors: Lereah Y.; Kofman R.; Pénisson J. M.; Deutscher G.; Cheyssac P.; David T.B.; Bourret A.

Structural change induced on an atomic scale by equilibrium sulphur segregation in tilt germanium grain boundaries
pp. 1821-1832(12)
Authors: Charaï A.; Benaissa M.; Alfonso C.; Fares L.; Duparc O.B.M.H.; Rouvière J-L.; Thibault J.

Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns?
pp. 1833-1846(14)
Authors: Van Aert S.; Van Dyck D.

High-resolution transmission electron microscopy study of ordered or disordered arrangements of Cu, C and N in the charge-reservoir blocks of a series of high-T_c superconductors: (Cu, C, N)Sr₂Ca_n-1Cu_nO_y (n=1-6)
pp. 1847-1860(14)
Authors: Anan Y.; Asaka T.; Takayama-Muromachi E.; Kimoto K.; Matsui Y.

Sub-ångström resolution of atomistic structures below 0.8 Å
pp. 1861-1878(18)
Authors: O'Keefe M. A.; Nelson E. C.; Wang Y. C.; Thust A.

Atomic structure of a complex defect configuration in synthetic diamond: a fivefold twin centre connected to two high-order grain boundaries
pp. 1879-1891(13)
Authors: Dorignac D.; Delclos S.; Phillipp F.