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Frequency standards, metrology and fundamental constants

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Abstract:

The most accurate experiments currently are those based on frequency measurement. These experiments include the determination of fundamental constants, which can be used to link frequency to the other base units of the SI system. This article discusses the development of atomic frequency standards and their application in metrology, in particular the determination of fundamental constants. Further advancements in frequency standards and metrology are considered, as well as the implications for fundamental physics.

Document Type: Research Article

DOI: https://doi.org/10.1080/00107910210164020

Publication date: 2003-03-01

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