Skip to main content

Thin film analysis with nuclear methods

Buy Article:

$55.00 plus tax (Refund Policy)

Nuclear physics provides a number of unique methods to analyse thin films in the range of tens to hundreds of nanometres thickness. This article first describes the basics and recent applications of the most prominent ion-beam analysis techniques, such as Rutherford backscattering, nuclear reaction analysis, elastic recoil detection, ion channelling, and particle induced X-ray emission. The use of microbeams in thin-film analysis will be sketched. In addition, some nuclear techniques using (implanted) radioactive probe nuclei will be shortly described, such as emission channelling, conversion electron Mossbauer spectroscopy and perturbed gamma-ray angular correlations. Mainly, such examples have been selected where combinations of these analysing techniques illustrate their respective power and limitations.
No Reference information available - sign in for access.
No Citation information available - sign in for access.
No Supplementary Data.
No Article Media
No Metrics

Document Type: Research Article

Publication date: 1999-11-01

More about this publication?
  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more