Communications in Statistics: Simulation and Computation

Two Moments of the Logitnormal Distribution
pp. 1263-1269(7)
Authors: Frederic, Patrizio; Lad, Frank

Model Selection When a Key Parameter is Constrained to be in an Interval
pp. 1270-1280(11)
Authors: Hossain, M. Z.; King, M. L.

PORT Hill and Moment Estimators for Heavy-Tailed Models
pp. 1281-1306(26)
Authors: Gomes, M. Ivette; Alves, M. Isabel Fraga; Santos, Paulo Araujo

Undercoverage of Wavelet-Based Resampling Confidence Intervals
pp. 1307-1315(9)
Authors: Tang, Liansheng; Woodward, Wayne; Schucany, William

Imputation in Data Fusion of Heterogeneous Data Sets A Model-Based Numerical Experiment
pp. 1316-1328(13)
Authors: Berchtold, Andre; Jeannin, Andre

An Adaptive Test for the Two-Sample Location Problem Based on U-Statistics
pp. 1329-1346(18)
Authors: Kossler, W.; Kumar, N.

A Multisample Rank Test for Location-Scale Parameters
pp. 1347-1355(9)
Author: Murakami, Hidetoshi

Spatial Regression Models Using Inter-Region Distances in a Non-Random Context
pp. 1356-1376(21)
Authors: Christou, Nicolas; Simon, Gary

A Simple Method for Constructing Multidimensional Distributions of Correlated Categorical Data
pp. 1377-1384(8)
Author: Choi, Hyun Jip

Distribution of the Λ-Criterion for Sphericity Test and Its Connection to a Generalized Dirichlet Model
pp. 1385-1395(11)
Authors: Thomas, Seemon; Thannippara, Alex

The Distribution of the Kolmogorov-Smirnov, Cramer-von Mises, and Anderson-Darling Test Statistics for Exponential Populations with Estimated Parameters
pp. 1396-1421(26)
Authors: Evans, Diane; Drew, John; Leemis, Lawrence

Fast Initial Response Features for Poisson GWMA Control Charts
pp. 1422-1439(18)
Authors: Chiu, Wen-Chih; Sheu, Shey-Huei

Attribute Charts for Zero-Inflated Processes
pp. 1440-1452(13)
Authors: Sim, C. H.; Lim, M. H.

A New Chart for Monitoring the Covariance Matrix of Bivariate Processes
pp. 1453-1465(13)
Authors: Costa, Antonio; Machado, Marcela

Minimum Variance and VOQL Chain Sampling Plans-ChSP-4(c1, c2)
pp. 1466-1478(13)
Author: Vidya, R.