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Publisher: Taylor and Francis Ltd

Volume 15, Number 2, 1 January 2002

A Contraction-based Ratio-cut Partitioning Algorithm
pp. 485-489(5)
Author: Saab, Youssef

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Improving Datapath Testability by Modifying Controller Specification
pp. 491-498(8)
Authors: Flottes, M.L.; Rouzeyre, B.; Volpe, L.

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Minimizing Spurious Switching Activities with Transistor Sizing
pp. 537-545(9)
Authors: Wróblewski, Artur; Schimpfle, Christian V.; Schumacher, Otto; Nossek, Josef A.

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Reduction of Power Dissipation in Dynamic BiCMOS Logic Gates by Transistor Reordering
pp. 547-553(7)
Authors: Rezaul Hasan, S.M.; Wahab, Yufridin

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