Development of a multiattribute synthetic-np chart
Over the last few decades, multiattribute control charts have been widely recommended in practice. They outperform the simultaneous uniattribute charts for monitoring multiattribute processes in many applications. Jolayemi [A statistical model for the design of multiattribute control
charts. Indian J Stat. 1999;61:351–365] developed a statistical model for the design of a multiattribute np (Mnp) chart. Based on this model, a multiattribute synthetic (MSyn) chart is proposed in this article. Furthermore, the main features of the MSyn chart and Mnp chart are integrated
to build a multiattribute Syn-np (MSyn-np) chart. The results of the comparative studies indicate that the new MSyn-np chart significantly outperforms the Mnp chart and MSyn chart by 83% and 27%, respectively, in terms of the average number of defectives over a wide range of process shifts
under different circumstances.
Keywords: MSyn-np chart; average number of defectives; control chart; multiattribute; statistical process control; uniattribute
Document Type: Research Article
Affiliations: 1: School of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore 2: School of Engineering, University of South Australia, Adelaide, Australia 3: LUNAM Université, Université de Nantes & IRCCyN UMR CNRS 6597, Nantes, France 4: College of Engineering, University of Sharjah, Sharjah, UAE
Publication date: 02 September 2014
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