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Publisher: Taylor and Francis Ltd

Volume 84, Number 1, 2 January 2014

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Control charts with switching and sensitizing runs rules for monitoring process variation
pp. 37-56(20)
Authors: Rakitzis, Athanasios C.; Antzoulakos, Demetrios L.

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A necessary power divergence-type family of tests for testing elliptical symmetry
pp. 57-83(27)
Authors: Batsidis, Apostolos; Martin, Nirian; Pardo, Leandro; Zografos, Konstantinos

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Random set modelling of three-dimensional objects in a hierarchical Bayesian context
pp. 107-123(17)
Authors: Micheas, Athanasios C.; Wikle, Christopher K.; Larsen, David R.

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A two-parameter estimator in the negative binomial regression model
pp. 124-134(11)
Authors: Huang, Jiewu; Yang, Hu

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A new lifetime distribution
pp. 135-150(16)
Authors: Ristić, Miroslav M.; Nadarajah, Saralees

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An entropy test for the Rayleigh distribution and power comparison
pp. 151-158(8)
Authors: Alizadeh Noughabi, Reza; Alizadeh Noughabi, Havva; Ebrahimi Moghaddam Behabadi, Alireza

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On testing inference in beta regressions
pp. 186-203(18)
Authors: Cribari-Neto, Francisco; Queiroz, Marcela P.F.

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Bayesian inference for the randomly censored Weibull distribution
pp. 215-230(16)
Authors: Danish, Muhammad Yameen; Aslam, Muhammad

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