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Publisher: Taylor and Francis Ltd

Volume 81, Numbers 7-8, July 2008

Phase transitions in functional thin films
pp. 603-606(4)
Authors: Noheda, Beatriz; Muller, Christophe

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First-principles modeling of strain in perovskite ferroelectric thin films
pp. 607-622(16)
Authors: Dieguez, Oswaldo; Vanderbilt, David

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Phase transitions in ultra-thin ferroelectric films and fine period multilayers
pp. 623-642(20)
Authors: Dawber, Matthew; Lichtensteiger, Celine; Triscone, Jean-Marc

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Epitaxially grown ferroelectric thin films for agile devices
pp. 643-665(23)
Authors: Perrin, A.; Rousseau, A.; Fasquelle, D.; Laur, V.; Bouquet, V.; Deputier, S.; Laurent, P.; Tanne, G.; Huret, F.; Carru, J. C.; Guilloux-Viry, M.

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Epitaxially grown ferroelectric thin films for memory applications (ferroelectric random access memories)
pp. 667-678(12)
Authors: Funakubo, Hiroshi; Oikawa, Takahiro; Yokoyama, Shintaro; Nagashima, Kuniharu; Nakaki, Hiroshi; Fujisawa, Takashi; Ikariyama, Rikyu; Yasui, Shintaro; Saito, Keisuke; Morioka, Hitoshi; Han, Hee; Baik, Sunggi; Kim, Yong Kwan; Suzuki, Toshimasa

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Effects of strain on magnetic anisotropy in Fe- and Co-based heterostructures
pp. 679-701(23)
Authors: Andersson, Gabriella; Hjorvarsson, Bjorgvin

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Interface engineering and strain in YBa2Cu3O7-δ thin films
pp. 703-716(14)
Authors: Huijben, Mark; Koster, Gertjan; Blank, Dave; Rijnders, Guus

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The effect of strain and strain symmetry on the charge-order transition in Bi0.4Ca0.6MnO3 films
pp. 717-727(11)
Authors: Christen, Hans; Varela, Maria; Kim, Dae Ho

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Progress in perovskite nickelate research
pp. 729-749(21)
Author: Catalan, G.

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Si/SiGe heterostructures for advanced microelectronic devices
pp. 751-772(22)
Authors: Berbezier, I.; Ronda, A.

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Amorphous-crystalline phase transitions in chalcogenide materials for memory applications
pp. 773-790(18)
Authors: Gille, T.; Meyer, K. De; Wouters, D. J.

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Resistance switching in oxide thin films
pp. 791-806(16)
Authors: Ignatiev, A.; Wu, N. J.; Chen, X.; Nian, Y. B.; Papagianni, C.; Liu, S. Q.; Strozier, J.

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Phase transitions in non-hydride switchable mirror thin films
pp. 807-813(7)
Author: Richardson, Thomas

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