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We directly formed the organic ferroelectric P(VDF-TrFE) 70/30 copolymer film by the spin coating for making the MFS structure in the silicon wafer. To understand the crystallization behavior of P(VDF-TrFE) 70/30 copolymer, the morphologies of copolymer thin films were studied by AFM and XRD. AFM studies revealed that as grown and annealed films showed surface roughness greater than amorphous films due to crystallization. The XRD spectrum of the films subjected to various annealing temperatures showed  -phase and this phase content was maximum at 140°C annealing. The capacitance shows hysteresis behavior like a buttery shape due to the polarization reversal in the film and this result indicates clearly that the film has a ferroelectric property. The dielectric constants of the P(VF2-TrFE) copolymer films calculated from the capacitance at the two peak points of the C-V characteristics were about 8.7.
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Keywords: C-V; MFS; P(VDF-TrFE); hysteresis; polarization

Document Type: Research Article

Affiliations: Convergence Components & Materials Research Laboratory, Electronics and Telecommunications Research Institute (ETRI), Daejeon, Korea

Publication date: 01 January 2008

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