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Publisher: Taylor and Francis Ltd

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Volume 74, Number 1, Volume 74/2005

GUEST EDITORIAL
pp. vii-vii(1)
Authors: TANG, TING-AO; SOLAYAPPAN, NARAYAN; BAIK, S.; DEY, SANDWIP; AUCIELLO, O.

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WELL-BEHAVED METAL-OXIDE-SEMICONDUCTOR CAPACITOR CHARACTERISTICS OF ZIRCONIUM OXIDE FILMS FABRICATED BY SURFACE SOL-GEL PROCESS
pp. 3-11(9)
Authors: SHAO, QI-YUE; LI, AI-DONG; CHENG, JIN-BO; XIA, YI-DONG; WU, DI; LIU, ZHI-GUO; MING, NAI-BEN

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MICROSTRUCTURES AND ELECTRICAL PROPERTIES OF PMNT CERAMICS DOPED WITH LITHIUM FLUORIDE
pp. 13-20(8)
Authors: CAO, LIN-HONG; YAO, XI; XU, ZHUO; LI, ZHEN-RONG

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EFFECT OF LITHIUM SALTS ADDITION ON SINTERING TEMPERATURE AND ELECTRICAL PROPERTIES OF PMNT CERAMICS
pp. 21-29(9)
Authors: CAO, LIN-HONG; YAO, XI; XU, ZHUO; LI, ZHEN-RONG

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AN INTERFACE KINETICS STUDY OF OXIDATION PROCESS OF SILICON
pp. 31-43(13)
Authors: FANG, F.; HA, M.; QIU, X.; LIU, J.

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DIELECTRIC PROPERTIES OF MnO 2 -DOPED 0.9PMN-0.1PT CERAMICS UNDER A DC BIAS FIELD
pp. 45-51(7)
Authors: HUANG, SHIMING; FENG, CHUDE; CHEN, LIDONG; WEN, XIAOWEI

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DIELECTRIC CHARACTERISTICS OF POLYMER-CERAMIC-METAL COMPOSITES FOR THE APPLICATION OF EMBEDDED PASSIVE DEVICES
pp. 53-60(8)
Authors: LIM, EUN-SUB; LEE, JONG-CHUL; KIM, JEONG-JOO; PARK, EUN-TAE; CHUNG, YUL-KYO; LEE, HEE-YOUNG

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MICROSTRUCTURE EVOLUTION AND DIELECTRIC PROPERTIES OF (Ba 1−x Sr x ) 4 Na 2 Nb 10 O 30 CERAMICS WITH DIFFERENT Ba/Sr RATIOS
pp. 61-70(10)
Authors: OH, CHANG-DAE; KIM, MYOUNG-SUP; LEE, JOON-HYUNG; KIM, JEONG-JOO; LEE, HEE; CHO, SANG-HEE

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ELECTRICAL CHARACTERIZATION OF ZIRCONIUM OXIDE LAYERS GROWN BY LIQUID DELIVERY MOCVD
pp. 113-122(10)
Authors: LISKER, M.; SILINSKAS, M.; MATICHYN, S.; BURTE, E.

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PRESSURE INDUCED DIELECTRIC CONSTANT SUPPRESSION IN CaCu 3 Ti 4 O 12 CERAMICS
pp. 123-130(8)
Authors: CHEN, AIPING; LI, WEI; LU, XIAOMEI; ZHU, JINSONG

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EFFECT OF NITROGEN INCORPORATION ON ELECTRICAL PROPERTIES OF HIGH- K NANOMIXED Hf x Al y O z FILM CAPACITORS GROWN ON RU METAL ELECTRODES BY ATOMIC LAYER DEPOSITION
pp. 131-136(6)
Authors: SEONG, NAK-JIN; YOON, SOON-GIL; YEOM, SEUNG-JIN; WOO, HYUN-KYUNG; KIL, DEOK-SIN; ROH, JAE-SUNG; SOHN, HYUN-CHUL

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THE MICROSTRUCTURE CHARACTERISTICS AND DIELECTRIC BEHAVIORS OF THE COMPOSITIONALLY GRADED Ba(Ti,Sn)O 3 THIN FILMS
pp. 137-145(9)
Authors: ZHAI, JIWEI; SONG, SANNIAN; YAO, XI; HUNG, T.; XU, ZHENGKUI; CHEN, HAYDN

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HIGH-TEMPERATURE AMORPHOUS HAFNIA (HfO 2 ) FOR MICROELECTRONICS
pp. 165-172(8)
Authors: MIYAKE, M.; LOU, X.; ZHANG, MING; MORRISON, F.; LEEDHAM, T.; TATSUTA, T.; TSUJI, O.; SCOTT, J.

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DIELECTRIC CHARACTERIZATION OF METAL-OXIDE-SEMICONDUCTOR CAPACITOR USING Ga 2 O 3 DIELECTRICS ON p -Si (100)
pp. 173-180(8)
Authors: LEE, SANG-A; JEONG, SE-YOUNG; HWANG, JAE-YEOL; KIM, JONG-PIL; HA, MYONG-GYU; CHO, CHAE-RYONG

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LEAKAGE CURRENT MECHANISMS OF SrTiO 3 THIN FILMS WITH MIS STRUCTURES
pp. 189-197(9)
Authors: MA, JIAN; MENG, XIANG; LIN, TIE; LIU, SHI; SUN, JING; CHU, JUN

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