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Volume 61, Number 1, Volume 61/2004

Current and Future High Density FRAM Technology
pp. 3-15(13)
Authors: KIM, KINAM; SONG, YOON

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Frequency Dependence of Polarization Hysteresis Loop in CaBi4 Ti4 O14 Ferroelectric Thin Films
pp. 19-23(5)
Authors: FU, DESHENG; SUZUKI, KAZUYUKI; KATO, KAZUMI

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Preparation and Characterizations of High-K (Ca, Sr)ZrO3 Gate Dielectric Thin Films by Sol-Gel Technology
pp. 25-35(11)
Authors: ZHU, W.; YU, T.; CHEN, C.; CHEN, X.; KRISHNAN, R.

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Ferroelectric Properties of Mo-Doped Bi4-XLaXTi3O12 Films
pp. 37-42(6)
Authors: OHKI, HIROSHI; WANG, XUSHENG; ISHIWARA, HIROSHI

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Inhomogeneous Local Conductivity Induced by Thermal Reduction in BaTiO3 Thin Films and Single Crystals
pp. 43-49(7)
Authors: REICHENBERG, B.; SZOT, K.; SCHNELLER, T.; BREUER, U.; TIEDKE, S.; WASER, R.

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Understanding Thickness Effects in Thin Film Capacitors
pp. 51-58(8)
Authors: LOOKMAN, A.; BOWMAN, R.; GREGG, J.; SCOTT, J.; DAWBER, MATT; RUEDIGER, A.

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P-E Measurements for Ferroelectric Gate Capacitors
pp. 59-64(6)
Authors: YOSHIMURA, TAKESHI; FUJIMURA, NORIFUMI

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High Frequency Thick Film BST Ferroelectric Phase Shifter
pp. 65-70(6)
Authors: YEO, K.; LANCASTER, M.; SU, B.; BUTTON, T.; SNM, M. KITTILļ; HAGBERG, J.; LEPPĖUORI, S.

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Fundamental Study on Ferroelectric Data Storage with the Density Above 1 Tbit/inch2 Using Congruent Lithium Tantalate
pp. 77-81(5)
Authors: CHO, YASUO; HIRANAGA, YOSHIOMI; FUJIMOTO, KENJIRO; WAGATSUMA, YASUO; ONOE, ATSUSHI

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Ferroelectric Non-Volatile Logic Devices
pp. 83-88(6)
Authors: TAKASU, HIDEMI; FUJIMORI, YOSHIKAZU; NAKAMURA, TAKASHI; KIMURA, HIROMITSU; HANYU, TAKAHIRO; KAMEYAMA, MICHITAKA

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Failure Analysis of FeCAPs. Electrical Behaviour Under Synchrotron X-Ray Irradiation
pp. 89-95(7)
Authors: MENOU, N.; CASTAGNOS, A.; MULLER, CH.; JOHNSON, J.; WOUTERS, D.; BATURIN, I.; SHUR, V.

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Advanced Integration Process Technology for Highly Reliable Ferroelectric Devices
pp. 97-103(7)
Authors: SONG, Y.; KANG, H.; JOO, H.; JANG, N.; KIM, H.; PARK, J.; KANG, S.; LEE, S.; KIM, KINAM

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Dielectric Properties of Spark Plasma Sintered (SPS) Barium Strontium Titanate (BST) Ceramics
pp. 117-122(6)
Authors: SU, B.; HE, J.; CHENG, B.; BUTTON, T.; LIU, J.; SHEN, Z.; NYGREN, M.

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Dielectric and Electrical Characteristics of the Barium Strontium Titanate Zirconium Thin Film by RF Sputtering
pp. 129-132(4)
Authors: CHEN, KAI-HUANG; TSAI, YU-ZEN; CHEN, YING-CHUNG; WANG, CHIA-JUNG

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On-Wafer Measurements of Tuneability in Ba0.5Sr0.5TiO3 Thin Films
pp. 133-137(5)
Authors: SUHERMAN, P.; JACKSON, T.; KOUTSONAS, Y.; CHAKALOV, R.; LANCASTER, M.

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Growth, Microwave Properties and Microstructure of Ba0.05Sr0.95TiO3 Thin Films
pp. 139-142(4)
Authors: KOUTSONAS, I.; HU, W.; JACKSON, T.; JONES, I.; LANCASTER, M.; PASSERIEUX, G.; CHAKALOV, R.; CHAKALOVA, R.; DARLINGTON, C. N.

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Investigation of Ferroelectricity in Ultrathin PbTiO3 Films
pp. 143-148(6)
Authors: LICHTENSTEIGER, C.; TRISCONE, J.

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Influence of Electron Irradiation on the Properties of Ferroelectric BaxSr1-xTiO3 Films
pp. 149-153(5)
Authors: PAVLOVSKAJA, M.; BALAKIN, V.; DEDYK, A.; KARMANENKO, S.; SAKHAROV, V.; SERENKOV, I.

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Dielectric Properties of Na0.5Bi0.5TiO3 – BaTiO3 Ceramics
pp. 155-158(4)
Authors: GOMAH-PETTRY, J.; MARCHET, P.; SIMON, A.; MLL, R.; MAGLIONE, M.; MERCURIO, J.

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Electrical Properties of Na0.5Bi0.5TiO3 – SrTiO3 Ceramics
pp. 159-162(4)
Authors: GOMAH-PETTRY, J.; MARCHET, P.; SALAK, A.; Ferreira, V.; MERCURIO, J.

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Thin Films of Na0.5Bi0.5TiO3 Deposited by Spin-Coating
pp. 163-165(3)
Authors: MERCURIO, J.; MARCHET, P.

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Lead Zirconate Titanate Film Formation Technology with Use of Spray Coating Method
pp. 167-172(6)
Authors: ICHIKI, MASAAKI; ZHANG, LULU; YANG, ZHEN; IKEHARA, TSUYOSHI; MAEDA, RYUTARO

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The Dielectric Properties of Ultrafine-Grained BaTi1 – xZrxO3 Based Ceramics Prepared by a Novel Two-Step Sintering Method
pp. 173-176(4)
Authors: WANG, XIAOHUI; LI, BAORANG; LI, XIAN; LI, LONGTU; GUI, ZHILUN

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Frequency Dependence of Microwave Quality Factor of Doped BaxSr1 - xTiO3 Ferroelectric Ceramics
pp. 177-181(5)
Authors: KARMANENKO, S.; NENASHEVA, E.; DEDYK, A.; KANAREIKYN, A.; SEMENOV, A.

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Effects of Thermal Stabilities for the Ultra Thin Chromium Layers Applied on (Ba, Sr)TiO3 Thin Films
pp. 183-187(5)
Authors: KUO, MENG-WEI; SHYE, DER-CHI; CHIOU, BI-SHIOU; CHEN, JYH-SHIN; CHENG, HUANG-CHUNG

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Fabrication and Properties of Silicon-Based PLZT Thin Films for MFSFET Applications
pp. 189-195(7)
Authors: SHAO, TIAN-QI; REN, TIAN-LING; LIU, LI-TIAN; ZHU, JUN; LI, ZHI-JIAN

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Pyroelectric Thin Films Integrated with CCD
pp. 197-204(8)
Authors: SIGOV, ALEXANDER; PEVTSOV, EUGENY; GORELOV, ANDREY; CHERNOKOZHIN, VLADIMIR

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Anomalous “Fatigue” Effect in High-Temperature Ferroelectric Crystal LaBGeO5
pp. 205-211(7)
Authors: MILOV, E.; MILOV, V.; STRUKOV, B.

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Reactive Ion Etching and Ion Beam Etching for Ferroelectric Memories
pp. 213-220(8)
Authors: SHAO, TIAN-QI; REN, TIAN-LING; LIU, LI-TIAN; ZHU, JUN; LI, ZHI-JIAN

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FIB Milled PZT Nanocapacitors Tested Using PFM
pp. 223-230(8)
Authors: MARSHALL, J.; DUNN, S.; WHATMORE, R.

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Epitaxial Lead Zirconate Titanate Nanocrystals Obtained by a Self-Patterning Method
pp. 231-238(8)
Authors: SZAFRANIAK, I.; CHU, M.; HARNAGEA, C.; SCHOLZ, R.; HESSE, D.; ALEXE, M.

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Thin Film Capacitor Cut from Single Crystals Using Focused Ion Beam Milling
pp. 239-248(10)
Authors: SAAD, M.; BOWMAN, R.; GREGG, J.

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Nano-Phased Crystallisation of Ferroelectrics from Glasses in the K2O-TiO2-P2O5 and K2O-Nb2O5-SiO2 Systems
pp. 249-253(5)
Authors: SIGAEV, V.; PERNICE, P.; ARONNE, A.; CHAMPAGNON, B.; GREGORA, I.; STEFANOVICH, S.; USMANOVA, L.; FANELLI, E.; POKORNY, J.

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Disorder in BaTiO3 and Ti EFG Tensors
pp. 255-260(6)
Authors: BLINC, R.; SELIGER, J.; ZALAR, BOŠTJAN

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