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Publisher: Taylor and Francis Ltd

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Volume 53, Number 1, Volume 53/2003

Guest Editorial
pp. vii-ix(3)
Authors: Joshi, Vikram; Agrawal, Sanjeev; Ramesh, R.

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Spacers Alternatives for INTEGRATION OF (3D) STACKED SBT FeCAPs
pp. 257-267(11)
Authors: Lisoni, J. G.; Johnson, J.; Everaert, J. L.; Paraschiv, V.; Boullart, W.; Maes, D.; Haspeslagh, L.; Wouters, D. J.; Caputa, C.; Casella, P.; Zambrano, R.; Vecchio, G.; Monchoix, H.; Van Autryve, L.

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Plasma Etch Processes for Embedded FRAM Integration
pp. 269-277(9)
Authors: Celii, Francis G.; Thakre, Mahesh; Gay, Mark K.; Summerfelt, Scott R.; Aggarwal, Sanjeev; Martin, J. Scott; Hall, Lindsey; Udayakumar, K. R.; Moise, Ted S.

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Characteristics of an Oxygen Barrier Based on Bi-layered Ir
pp. 279-286(8)
Authors: Moon, B. K.; Arisumi, O.; Bruchhaus, R.; Tsutsumi, K.; Itokawa, H.; Hornik, K.; Tsuchiya, T.; Hilliger, A.; Lian, J.; Pinnow, C. U.; Ozaki, T.; Kunishima, I.; Nagel, N.; Yamakawa, K.; Beitel, G.

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Fabrication of Pb(Zr, Ti)O3 Thin Films by Liquid Source Misted Chemical Deposition Method Equipped with a Mist-Droplet Size Controller
pp. 287-297(11)
Authors: Kawasaki, Susumu; Motoyama, Shin-Ichi; Tatsuta, Toshiaki; Tsuji, Osamu; Shiosaki, Tadashi

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Novel Common Cell Via and Etch Stopper Technology for 0.25 M 1T1C 32 MBIT FRAM
pp. 299-305(7)
Authors: Jang, N. W.; Song, Y. J.; Kim, H. H.; Joo, H. J.; Park, J. H.; Kang, H. Y.; Lee, S. Y.; Kim, Kinam

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Novel Damage Curing Technology on One-Mask Etched Ferroelectric Capacitor for Beyond 0.25 m FRAM
pp. 307-315(9)
Authors: Park, J. H.; Kim, H. H.; Jang, N. W.; Song, Y. J.; Joo, H. J.; Kang, H. Y.; Lee, S. Y.; Kim, Kinam

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Advances in Etching High-Density Embedded FRAM Structures
pp. 325-332(8)
Authors: Ying, Chris; Mananquil, Reggie; Patz, Ryan; Sabharwal, Amitabh; Kumar, Ajay; Celii, Francis; Thakre, Mahesh; Gay, Mark; Kraft, Robert; Summerfelt, Scott; Moise, Ted

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The Profile and Device Characterization of High Wafer Temperature Etched Ir/PZT/Ir Stacks
pp. 333-340(8)
Authors: Marks, S.; Almerico, J. P.; Gay, M. K.; Celii, F. G.

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Characterization of Hynix 16M Feram Adopted Novel Sensing Scheme
pp. 343-351(9)
Authors: Lee, Seaung-Suk; Noh, Keum-Hwan; Kang, Hee-Bok; Hong, Suk-Kyoung; Yeom, Seung-Jin; Park, Young-Jin

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Cell Signal Distribution and Imprint Reliability in FeRAM with Hybrid Bit Line Architecture
pp. 353-359(7)
Authors: Noh, Keum Hwan; Lee, Seaung-Suk; Kang, Hee-Bok; Jeong, Hyuk-Je; Yang, Young-Ho; Oh, Sang-Hyun; Kim, Jin-Gu; Seong, Jin-Yong; Hong, Suk-Kyoung; Park, Young-Jin

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Non-Linear Imprint Behavior of PZT Thin Films
pp. 361-369(9)
Authors: Schorn, P.; Ellerkmann, U.; Bolten, D.; Boettger, U.; Waser, R.

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High Speed and High Resolution Measurements on Submicron Capacitors for FeRAM Application
pp. 371-378(8)
Authors: Schmitz, T.; Tiedke, S.; Prume, K.; Roelofs, A.; Szot, K.; Waser, R.

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New Approach to Analysis of the Switching Current Data, Recorded During Conventional Hysteresis Measurements
pp. 379-390(12)
Authors: Shur, Vladimir Ya.; Baturin, Ivan S.; Shishkin, Eugene I.; Belousova, Marina V.

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Depth Profiling of Hydrogen and Oxygen in Ferroelectric Films Using High-Energy Ion Beam
pp. 391-399(9)
Authors: Kaneko, T.; Watamori, M.; Makita, H.; Araujo, C.; Kano, G.

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Mechanism of Charge Retention Loss in Ferroelectric Pt/Pb(Zr,Ti)O3/Pt Capacitors and Its Relation to Fatigue and Imprint
pp. 401-411(11)
Authors: Yoon, Jong-Gul; Kang, B. S.; Kim, J. D.; Noh, T. W.; Song, T. K.; Lee, Y. K.; Lee, J. K.

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Dielectric Properties of Ba0.5Sr0.5TiO3 Thin Films from DC to Ka Band
pp. 413-420(8)
Authors: Cramer, N.; Kalkur, T. S.; Philofsky, E.; Kammerdiner, L.

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Characterization of Ferroelectric Properties of PZT Grains Utilizing KFM Measurements
pp. 421-430(10)
Authors: Heo, Jinhee; Kim, Deoksoo; Chung, Ilsub

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Study on the Surface Potential Behavior of Ultra Thin PZT Utilizing SPM (Scanning Probe Microscope)
pp. 431-441(11)
Authors: Lee, Kyewon; Ham, Hochan; Yi, Insook; Chung, Ilsub

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Piezoelectric Properties of Microwave-Sintered (Pb0.76Ca0.24)[(Co0.5W0.5)0.04Ti0.96]O3 Ceramics
pp. 443-454(12)
Authors: Chen, Cheng-Sao; Lin, Sheng-Kuo; Chou, Chen-Chia; Chen, Chang-Shun

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Structural Investigation of Thin SrTiO3 Films Grown on MgO and LaAlO3 Substrates
pp. 465-473(9)
Authors: Petrov, P. K.; Alford, N. Mcn.; Astafiev, K. F.; Tagantsev, A. K.; Setter, N.; Kaydanova, T.; Ginley, D. S.

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Random-Site Cation Ordering and Dielectric Properties of PbMg1/3Nb2/3O3-PbSc1/2Nb1/2O3
pp. 475-487(13)
Authors: Raevski, I. P.; Prosandeev, S. A.; Emelyanov, S. M.; Savenko, F. I.; Zakharchenko, I. N.; Bunina, O. A.; Bogatin, A. S.; Raevskaya, S. I.; Gagarina, E. S.; Sahkar, E. V.; Jastrabik, L.

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Microstructures and Piezoelectric Properties of Microwave-Sintered Pb(Mn1/3Nb2/3)0.1Zr0.52Ti0.38O3 Ceramics
pp. 489-501(13)
Authors: Chen, Cheng-Sao; Hsu, Chi-Hua; Chou, Chen-Chia

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Observation of Long Transients in the Electrical Characterization of Thin Film BST Capacitors
pp. 503-511(9)
Authors: Pervez, N. K.; Hansen, P. J.; Taylor, T. R.; Speck, J. S.; York, R. A.

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