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Publisher: Taylor and Francis Ltd

Volume 25, Number 3, 1 January 2002

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ANALYSIS AND SIMULATION OF FUNCTIONAL STRESS DEGRADATION ON VDMOS POWER TRANSISTORS
pp. 215-223(9)
Authors: ZOAETER, M.; BEYDOUN, B.; HAJJAR, M.; DEBS, M.; CHARLES, J-P

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A NEW JUNCTION PARAMETERS DETERMINATION USING THE DOUBLE EXPONENTIAL MODEL
pp. 225-232(8)
Authors: DIB, S.; KHOURY, A.; PEĀ“LANCHON, F.; MIALHE*, P.

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