Home >> Critical Reviews in Solid State and Material Sciences, Volume 25, Number 1
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Volume 25, Number 1, January-March 2000

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Nanometer Scale Electrical Characterization of Artificial Mesostructures
pp. 1-28(28)
Authors: Durkan, C.; Welland, M. E.

Thin-Film Electroluminescent Device Physics Modeling
pp. 29-85(57)
Authors: Hitt, J. C.; Bender, J. P.; Wager, J. F.

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