Skip to main content
Home / Spectroscopy and Spectral Analysis, Volume 32, Number 4

Study of the Raman-AFM System for Simultaneous Measurements of Raman Spectrum and Micro/Nano-Structures

Buy Article:

$28.00 + tax (Refund Policy)

This paper proposes a novel technique of Raman-atomic force microscopy (AFM) combining micro region Raman spectroscopy and AFM imaging. An in-situ probe unit which can simultaneously realize the detection of Raman spectrum and the measurement of AFM image was designed, and a related Raman-AFM system was constructed. Using this system, some experiments were carried out to acquire micro region Raman spectra and AFM images of ZnO nano-particle and TiO2 film. The results show that the Raman spectra of both samples are in agreement with theoretical vaues, and the AFM images represent their micro/nano-structures quite well. These researches prove the feasibility of the Raman-AFM technique which has the potential of being widely applied in the fields of Raman spectroscopy and micro/nano-technology.

Keywords: AFM; Micro region; Micro/nano-structure; Raman spectroscopy; in-situ

Document Type: Research Article

Publication date: 01 April 2012

More about this publication?
  • Spectroscopy and Spectral Analysis, founded in 1981, is sponsored by the Chinese Central Iron & Steel Research Institute. "Spectroscopy and Spectral Analysis" has been indexed in SCI(1999), Ei(1992), MEDLINE(1999), and AJ (1999). "Spectroscopy and Spectral Analysis" publishes original contributions on various fields in Spectroscopy, including research results on laser spectroscopy, IR, Ramn, UV/Vis, Optical Emission, Absorption and Fluorescence spectroscopy, X-ray Fluorescence, and Spectrochemical Analysis, as well as Reseach paper, Research notes, Experimental Technique and Instrument, Review and Progress on the latest development of spectroscopy and spectrochemical anlysis, etc. "Spectroscopy and Spectral Analysis" is published monthly by Peking University Press with book sizes of large 16-mo format , and 292 pages per issue.
  • Editorial Board
  • Submit a Paper
  • Ingenta Connect is not responsible for the content or availability of external websites

Share Content

  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content