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Quantitative Nano-characterization of Polymers Using Atomic Force Microscopy

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The present article offers an overview on the use of atomic force microscopy (AFM) to characterize the nanomechanical properties of polymers. AFM imaging reveals the conformations of polymer molecules at solid– liquid interfaces. In particular, for polyelectrolytes, the effect of ionic strength on the conformations of molecules can be studied. Examination of force versus extension profiles obtained using AFM-based single molecule force spectroscopy gives information on the entropic and enthalpic elasticities in pN to nN force range. In addition, single molecule force spectroscopy can be used to trigger chemical reactions and transitions at the molecular level when force-sensitive chemical units are embedded in a polymer backbone.
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Keywords: AFM IMAGING; ATOMIC FORCE MICROSCOPY; MECHANOCHEMISTRY; SINGLE MOLECULE FORCE SPECTROSCOPY; SINGLE MOLECULES

Document Type: Research Article

Affiliations: 1: Department of Inorganic and Analytical Chemistry University of Geneva Sciences II 30, Quai Ernest-Ansermet CH-1211 Geneva 4;, Email: [email protected] 2: Department of Inorganic and Analytical Chemistry University of Geneva Sciences II 30, Quai Ernest-Ansermet CH-1211 Geneva 4 3: Department of Chemistry University of Fribourg Chemin du Musée 9, CH-1700 Fribourg 4: Adolphe Merkle Institute University of Fribourg Chemin des Verdiers 4, CH-1700 Fribourg

Publication date: 2017-04-01

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  • International Journal for Chemistry and Official Membership Journal of the Swiss Chemical Society (SCS) and its Divisions

    CHIMIA, a scientific journal for chemistry in the broadest sense, is published 10 times a year and covers the interests of a wide and diverse readership. Contributions from all fields of chemistry and related areas are considered for publication in the form of Review Articles and Notes. A characteristic feature of CHIMIA are the thematic issues, each devoted to an area of great current significance.

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