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The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge.

Previously published as Bulletin (Society for Applied Spectroscopy)

Applied Spectroscopy was previously published as Bulletin (Society for Applied Spectroscopy).

Publisher: Society for Applied Spectroscopy

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Volume 68, Issue 6, Pages 134A-144A and 617-695 (June 2014)

Free Content Spectroscopists' Calendar
pp. 134A-137A(4)
Author: Carrabba, Mary

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Free Content What's New 2014 Buyer's Guide
pp. 138A-143A(6)
Author: Craven, Lee

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Free Content Applied Spectroscopy News
pp. 144A-144A(1)
Author: Haibach, Fred G.

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Surface-Enhanced Raman Scattering-Based Detection of Cancerous Renal Cells
pp. 617-624(8)
Authors: Mert, Sevda; Çulha, Mustafa

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Confocal Raman Microscopy for Investigating Synthesis and Characterization of Individual Optically Trapped Vinyl-Polymerized Surfactant Particles
pp. 633-641(9)
Authors: Schaefer, Jonathan J.; Crawford, Alexis C.; Porter, Marc D.; Harris, Joel M.

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Fast Determination of Thiacloprid by Photoinduced Chemiluminescence
pp. 642-648(7)
Authors: Catalá-Icardo, Mónica; López-Paz, José Luis; Pérez-Plancha, Laura María

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Experimental Study of Laser-Induced Breakdown Spectroscopy (LIBS) for Direct Analysis of Coal Particle Flow
pp. 672-679(8)
Authors: Zheng, Jianping; Lu, Jidong; Zhang, Bo; Dong, Meirong; Yao, Shunchun; Lu, Weiye; Dong, Xuan

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White Light Photothermal Lens Spectrophotometer for the Determination of Absorption in Scattering Samples
pp. 680-685(6)
Authors: Marcano, Aristides; Alvarado, Salvador; Meng, Junwei; Caballero, Daniel; Moares, Ernesto Marín; Edziah, Raymond

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Open Access Subsurface Raman Analysis of Thin Painted Layers
pp. 686-691(6)
Authors: Conti, Claudia; Colombo, Chiara; Realini, Marco; Zerbi, Giuseppe; Matousek, Pavel

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A Line-Scan Hyperspectral System for High-Throughput Raman Chemical Imaging
pp. 692-695(4)
Authors: Qin, Jianwei; Chao, Kuanglin; Kim, Moon S.

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