Extracting Infrared Absolute Reflectance from Relative Reflectance Measurements

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Absolute reflectance measurements are valuable to the optics industry for development of new materials and optical coatings. Yet, absolute reflectance measurements are notoriously difficult to make. In this paper, we investigate the feasibility of extracting the absolute reflectance from a relative reflectance measurement using a reference material with known refractive index.

Keywords: Absolute reflectance; FT-IR spectroscopy; Fourier transform infrared spectroscopy; Reflectance reference

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/11-06560

Affiliations: Harrick Scientific Products, Pleasantville, New York 10570, USA

Publication date: June 1, 2012

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