Extracting Infrared Absolute Reflectance from Relative Reflectance Measurements

Authors: Berets, Susan L.; Milosevic, Milan

Source: Applied Spectroscopy, Volume 66, Issue 6, Pages 156A-170A and 609-730 (June 2012) , pp. 680-684(5)

Publisher: Society for Applied Spectroscopy

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Abstract:

Absolute reflectance measurements are valuable to the optics industry for development of new materials and optical coatings. Yet, absolute reflectance measurements are notoriously difficult to make. In this paper, we investigate the feasibility of extracting the absolute reflectance from a relative reflectance measurement using a reference material with known refractive index.

Keywords: Absolute reflectance; Reflectance reference; Fourier transform infrared spectroscopy; FT-IR spectroscopy

Document Type: Research article

DOI: http://dx.doi.org/10.1366/11-06560

Affiliations: 1: Harrick Scientific Products, Pleasantville, New York 10570, USA

Publication date: 2012-06-01

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