Authors: Deneckere, Annelien¹; de Vries, Lieke²; Vekemans, Bart³; Voorde, Lien Van de³; Ariese, Freek⁴; Vincze, Laszlo³; Moens, Luc⁵; Vandenabeele, Peter⁶

Source: Applied Spectroscopy, Volume 65, Issue 11, Pages 320A-340A and 1223-1324 (November 2011) , pp. 1281-1290(10)

Publisher: Society for Applied Spectroscopy

Abstract:

Raman spectroscopy and X-ray fluorescence (XRF) spectroscopy are often used as complementary techniques that are well suited for the analysis of art objects because both techniques are fast, sensitive, and noninvasive and measurements can take place in situ. In most of these studies, both techniques are used separately, in the sense that the spectra are evaluated independently and single conclusions are obtained, considering both results. This paper presents a data fusion procedure for Raman and XRF data for the characterization of pigments used in porcelain cards. For the classification of the analyzed points of the porcelain cards principal component analysis (PCA) was used. A first attempt was made to develop a new procedure for the identification of the pigments using a database containing the fused Raman-XRF data of 24 reference pigments. The results show that the classification based on the fused Raman-XRF data is significantly better than the classifications based on the Raman data or the XRF data separately.

Keywords: RAMAN SPECTROSCOPY; X-RAY FLUORESCENCE SPECTROSCOPY; XRF; DATA FUSION; IDENTIFICATION PROCEDURE; PRINCIPAL COMPONENT ANALYSIS; PCA; CULTURAL HERITAGE; ART CONSERVATION

Document Type: Research article

DOI: http://dx.doi.org/10.1366/11-06368

Affiliations: 1: Ghent University, Research group Raman spectroscopy, Department of Analytical Chemistry, Krijgslaan 281, S12, B-9000 Ghent, Belgium. Raman@UGent.be 2: Ghent University, Research group Raman spectroscopy, Department of Analytical Chemistry, Krijgslaan 281, S12, B-9000 Ghent, Belgium, VU University, Department of Applied Spectroscopy, F-NW, De Boelelaan 1085, 1081 Amsterdam, The Netherlands 3: Ghent University, Research group X-ray microspectroscopy and imaging, Department of Analytical Chemistry, Krijgslaan 281, S12, B-9000 Ghent, Belgium 4: VU University, Department of Applied Spectroscopy, F-NW, De Boelelaan 1085, 1081 Amsterdam, The Netherlands 5: Ghent University, Research group Raman spectroscopy, Department of Analytical Chemistry, Krijgslaan 281, S12, B-9000 Ghent, Belgium 6: Ghent University, Department of Archaeology, Sint-Pietersnieuwstraat 35, B-9000 Ghent, Belgium

Publication date: 2011-11-01

More about this publication?

• The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge.
  
  Previously published as Bulletin (Society for Applied Spectroscopy)
• Editorial Board
• Information for Authors
• Submit a Paper
• Subscribe to this Title
• Membership Information
• Request copyrighted SAS materials
• Spectroscopic Nomenclature
• Focus Compendium
• ingentaconnect is not responsible for the content or availability of external websites

Related content

• In this: publication
• By this: publisher
• In this Subject: Analytical Chemistry
• By this author: Deneckere, Annelien ;  de Vries, Lieke ;  Vekemans, Bart ;  Voorde, Lien Van de ;  Ariese, Freek ;  Vincze, Laszlo ;  Moens, Luc ;  Vandenabeele, Peter

Website © Publishing Technology. Article copyright remains with the publisher, society or author(s) as specified within the article.

• Terms and conditions
• Privacy policy
• Information for advertisers