Accurate Wavelength Calibration Method for Flat-Field Grating Spectrometers
Authors: Du, Xuewei1; Li, Chaoyang1; Xu, Zhe2; Wang, Qiuping3
Source: Applied Spectroscopy, Volume 65, Issue 9, Pages 250A-272A and 967-1086 (September 2011) , pp. 1083-1086(4)
Publisher: Society for Applied Spectroscopy
Abstract:
A portable spectrometer prototype is built to study wavelength calibration for flat-field grating spectrometers. An accurate calibration method called parameter fitting is presented. Both optical and structural parameters of the spectrometer are included in the wavelength calibration model, which accurately describes the relationship between wavelength and pixel position. Along with higher calibration accuracy, the proposed calibration method can provide information about errors in the installation of the optical components, which will be helpful for spectrometer alignment.Keywords: WAVELENGTH CALIBRATION; PARAMETER FITTING; SPECTROMETER ALIGNMENT; FLAT-FIELD SPECTROMETERS; SPHERICAL VARIED LINE SPACE GRATINGS
Document Type: Research article
DOI: http://dx.doi.org/10.1366/11-06280
Affiliations: 1: University of Science and Technology of China, Hefei, Anhui 230029, P. R. China 2: School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, P. R. China 3: University of Science and Technology of China, Hefei, Anhui 230029, P. R. China;, Email: qiuping@ustc.edu.cn
Publication date: 2011-09-01
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
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- By this author: Du, Xuewei ; Li, Chaoyang ; Xu, Zhe ; Wang, Qiuping

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