Authors: Lovrinčić, Robert¹; Noebel, Sebastian¹; Pucci, Annemarie²

Source: Applied Spectroscopy, Volume 65, Issue 1, Pages 6A-30A and 1-125 (January 2011) , pp. 105-107(3)

Publisher: Society for Applied Spectroscopy

Abstract:

The ultra-high-vacuum growth of thin chromium and aluminum films on single diamond crystals at various temperatures was monitored by means of infrared spectroscopy, which provides instant information on electronic and morphological properties of the produced metal films. In accordance with atomic force microscopy results, spectra for Al indicate a clear island-like growth in the beginning followed by a transition to a continuous layer. Cr growth results in much smoother films because of a special growth mechanism. Analysis of infrared spectra of both kinds of ultrathin metal layers yields a high DC conductivity well above 10⁶ S/m starting from only a few nanometers thickness for sufficiently high substrate temperatures.

Keywords: INFRARED SPECTROSCOPY; THIN-FILM GROWTH; METAL-DIAMOND INTERFACES; ELECTRONIC PROPERTIES OF THIN FILMS

Document Type: Research article

DOI: http://dx.doi.org/10.1366/10-06081

Affiliations: 1: Kirchhoff-Institut für Physik der Universität Heidelberg, Im Neuenheimer Feld 227, 69120 Heidelberg, Germany 2: Kirchhoff-Institut für Physik der Universität Heidelberg, Im Neuenheimer Feld 227, 69120 Heidelberg, Germany. pucci@kip.uni-heidelberg.de

Publication date: 2011-01-01

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