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Combined Apertureless Near-Field Optical Second-Harmonic Generation/Atomic Force Microscopy Imaging and Nanoscale Limit of Detection

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Abstract:

A dual function atomic force/near-field scanning optical microscope (AFM/NSOM) with an ultrafast laser excitation source was used to investigate apertureless, tip enhanced second-harmonic generation (SHG) of ZnO nanowires with spatial resolution below the optical diffraction limit. Single-wire SHG spectra show little to no contribution from bandgap or other emission. Polarization data established values for χ3331 close to previous estimates and confirm the SHG process. Experimental results indicate that the SHG signal was reduced for nanowires after exposure to an atmosphere of carbon dioxide and water vapor. An equation was derived for estimating the minimum χ(2) detectable using apertureless SHG NSOM.

Keywords: APERTURELESS; CARBONATE; DEGRADATION; NANOROD; NANOWIRE; NEAR-FIELD; NONLINEAR; NSOM; PASSIVATION; SECOND-HARMONIC GENERATION; SHG; SURFACE; TIP ENHANCEMENT; ZINC OXIDE

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/000370210790572070

Affiliations: 1: Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, 37831 2: Department of Chemistry, California State University-Fresno, Fresno, California 93740-8034 3: Faculty of Engineering and Department of Physics and Astronomy, University of Georgia, Athens, Georgia 30602

Publication date: January 1, 2010

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