How to Deal with Some Spurious Fringes in Fourier Transform Infrared Spectrometers

Authors: Max, Jean-Joseph1; Chapados, Camille2

Source: Applied Spectroscopy, Volume 62, Issue 10, Pages 244A-270A and 1049-1171, (October 2008) , pp. 1167-1171(5)

Publisher: Society for Applied Spectroscopy

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Abstract:

Faulty fringes coming from an infrared spectrometer may creep into a spectrum. Because these come from one faulty interferogram out of many used to obtain the spectrum, these may pass unnoticed. However, they cause some problems in the data treatment of factor analysis and other spectral analysis. We present a method for detecting the faulty fringes and give a simple method to eliminate them at the interferogram accumulation level.

Keywords: ANOMALOUS FRINGES; CORRECTING PROCEDURE; FAULTY INTERFEROGRAMS; INFRARED SPECTROSCOPY; IR SPECTROSCOPY

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/000370208786049132

Affiliations: 1: ITF Labs, 400 Montpellier, Montréal, QC, Canada, H4N 2G7 2: Département de chimie–biologie, Université du Québec à Trois-Rivières, Trois-Rivières, QC, Canada G9A 5H7

Publication date: October 1, 2008

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