Attenuated Total Reflection-Fourier Transform Infrared Imaging of Large Areas Using Inverted Prism Crystals and Combining Imaging and Mapping
Authors: Chan, K. L. Andrew; Kazarian, Sergei G.
Source: Applied Spectroscopy, Volume 62, Issue 10, Pages 244A-270A and 1049-1171, (October 2008) , pp. 1095-1101(7)
Publisher: Society for Applied Spectroscopy
Abstract:
Attenuated total reflection-Fourier transform infrared (ATR-FT-IR) imaging is a very useful tool for capturing chemical images of various materials due to the simple sample preparation and the ability to measure wet samples or samples in an aqueous environment. However, the size of the array detector used for image acquisition is often limited and there is usually a trade off between spatial resolution and the field of view (FOV). The combination of mapping and imaging can be used to acquire images with a larger FOV without sacrificing spatial resolution. Previous attempts have demonstrated this using an infrared microscope and a Germanium hemispherical ATR crystal to achieve images of up to 2.5 mm × 2.5 mm but with varying spatial resolution and depth of penetration across the imaged area. In this paper, we demonstrate a combination of mapping and imaging with a different approach using an external optics housing for large ATR accessories and inverted ATR prisms to achieve ATR-FT-IR images with a large FOV and reasonable spatial resolution. The results have shown that a FOV of 10 mm × 14 mm can be obtained with a spatial resolution of approximately 40-60 μm when using an accessory that gives no magnification. A FOV of 1.3 mm × 1.3 mm can be obtained with spatial resolution of approximately 15-20 μm when using a diamond ATR imaging accessory with 4× magnification. No significant change in image quality such as spatial resolution or depth of penetration has been observed across the whole FOV with this method and the measurement time was approximately 15 minutes for an image consisting of 16 image tiles.Keywords: FOURIER TRANSFORM INFRARED IMAGING; FT-IR IMAGING; ATTENUATED TOTAL REFLECTION; ATR; MAPPING; MACRO IMAGE; FINGERPRINTS
Document Type: Research article
DOI: http://dx.doi.org/10.1366/000370208786049042
Affiliations: 1: Department of Chemical Engineering, Imperial College London, London, SW7 2AZ, UK
Publication date: 2008-10-01
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- By this author: Chan, K. L. Andrew ; Kazarian, Sergei G.

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