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The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge.

Previously published as Bulletin (Society for Applied Spectroscopy)

Applied Spectroscopy was previously published as Bulletin (Society for Applied Spectroscopy).

Publisher: Society for Applied Spectroscopy

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Volume 62, Issue 2, Pages 32A-72A and 133-257 (February 2008)

Cover Feature
pp. 32A-32A(1)

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Spectroscopists' Calendar
pp. 36A-38A(3)
Author: Carrabba, Mary

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What's New 2008 Buyer's Guide
pp. 40A-44A(5)
Author: Craven, Lee

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Applied Spectroscopy News
pp. 45A-46A(2)
Author: Bradshaw, Deborah K.

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Book Reviews
pp. 47A-47A(1)
Author: Scheeline, Alexander

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The Coblentz Society Newsletter
pp. 48A-54A(7)
Author: Trimble, David S.

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Open Access Fiber-Optic Evanescent Wave Spectroscopy in the Middle Infrared
pp. 55A-72A(18)
Authors: Raichlin, Y.; Katzir, A.

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Excess Infrared Absorption Spectroscopy and Its Applications in the Studies of Hydrogen Bonds in Alcohol-Containing Binary Mixtures
pp. 166-170(5)
Authors: Li, Qingzhong; Wang, Nannan; Zhou, Qun; Sun, Suqin; Yu, Zhiwu

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Anisotropy Studied by Polarization-Modulated Fourier Transform Infrared Reflection Difference Microspectroscopy
pp. 171-175(5)
Authors: Schmidt, M.; Lee, J. S.; Grunze, M.; Kim, K. H.; Schade, U.

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Fabrication and Elimination of PTAA/P4VP Layer-by-Layer Films
pp. 207-212(6)
Authors: Jiang, Yan; Wu, Peiyi

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Speciation of Europium (III) Surface Species on Monocrystalline Alumina Using Time-Resolved Laser-Induced Fluorescence–Scanning Near-Field Optical Microscopy
pp. 213-219(7)
Authors: Ghaleb, Khalil Abbas; Viala, François; Miserque, Frederic; Salmon, Laurent; Reiller, Pascal; Moutiers, Gilles

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Optical Beating of Polychromatic Light and Its Impact on Time-Resolved Spectroscopy. Part I: Theory
pp. 220-229(10)
Authors: Walewski, Joachim W.; Filipa, Jonathan A.; Sanders, Scott T.

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Determination of the Ionization Potentials of Security-Relevant Substances with Single Photon Ionization Mass Spectrometry Using Synchrotron Radiation
pp. 238-247(10)
Authors: Schramm, E.; Mühlberger, F.; Mitschke, S.; Reichardt, G.; Schulte-Ladbeck, R.; Pütz, M.; Zimmermann, R.

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