Grazing Angle Attenuated Total Reflection Spectroscopy: Fields at the Interface and Source of the Enhancement

Authors: Milosevic, Milan¹; Milosevic, Violet¹; Berets, S.L.¹

Source: Applied Spectroscopy, Volume 61, Issue 5, Pages 94A-102A and 459-569 (May 2007) , pp. 530-536(7)

Publisher: Society for Applied Spectroscopy

Key:

- Free Content

- New Content

- Subscribed Content

- Free Trial Content

Abstract:

With the tremendous growth in the semiconductor and coatings industries, spectroscopic methods of examining extremely thin films on high refractive index substrates have become increasingly important. One infrared method for analyzing monolayers on substrates such as silicon and gold that has recently gained popularity is 'grazing' or high angle of incidence attenuated total reflection (ATR) spectroscopy. This paper investigates the directional electric field strengths and the extraordinary sensitivity achieved by using the grazing angle ATR method for analyzing monolayers on silicon substrates.

Keywords: ATTENUATED TOTAL REFLECTION SPECTROSCOPY; ATR SPECTROSCOPY; MONOLAYERS; SILICON SUBSTRATE; METAL SUBSTRATE; ELECTRIC FIELD STRENGTH; SENSITIVITY ENHANCEMENT

Document Type: Research article

DOI: 10.1366/000370207780807687

Affiliations: 1: MeV Photonics, Westport, Connecticut 06880; Harrick Scientific Products, Pleasantville, New York 10570

The full text electronic article is available for purchase. You will be able to download the full text electronic article after payment.

$29.00 plus tax Refund Policy