Observation of a Penetration Depth Gradient in Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging Applications

Authors: Wessel, Elke¹; Heinsohn, Guido¹; Schmidt-Lewerkuehne, Hartmut¹; Wittern, Klaus-Peter¹; Rapp, Claudius¹; Siesler, Heinz W.²

Source: Applied Spectroscopy, Volume 60, Issue 12, Pages 298A-334A and 1353-1494 (December 2006) , pp. 1488-1492(5)

Publisher: Society for Applied Spectroscopy

Keywords: ATTENUATED TOTAL REFLECTION INFRARED IMAGING; ATR IMAGING; FOURIER TRANSFORM INFRARED IMAGING; FT-IR IMAGING; PENETRATION DEPTH

Document Type: Short communication

DOI: http://dx.doi.org/10.1366/000370206779321391

Affiliations: 1: Beiersdorf AG, Research and Development, Unnastraße 48, D-20253 Hamburg, Germany 2: Department of Physical Chemistry, University of Duisburg-Essen, Campus Essen, Schuetzenbahn 70, D45117 Essen, Germany

Publication date: 2006-12-01

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