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Observation of a Penetration Depth Gradient in Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging Applications

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Keywords: ATR IMAGING; ATTENUATED TOTAL REFLECTION INFRARED IMAGING; FOURIER TRANSFORM INFRARED IMAGING; FT-IR IMAGING; PENETRATION DEPTH

Document Type: Short Communication

DOI: http://dx.doi.org/10.1366/000370206779321391

Affiliations: 1: Beiersdorf AG, Research and Development, Unnastra├če 48, D-20253 Hamburg, Germany 2: Department of Physical Chemistry, University of Duisburg-Essen, Campus Essen, Schuetzenbahn 70, D45117 Essen, Germany

Publication date: December 1, 2006

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