Fungus Covered Insulator Materials Studied with Laser-Induced Fluorescence and Principal Component Analysis

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Abstract:

A method combining laser-induced fluorescence and principal component analysis to detect and discriminate between algal and fungal growth on insulator materials has been studied. Eight fungal cultures and four insulator materials have been analyzed. Multivariate classifications were utilized to characterize the insulator material, and fungal growth could readily be distinguished from a clean surface. The results of the principal component analyses make it possible to distinguish between algae infected, fungi infected, and clean silicone rubber materials. The experiments were performed in the laboratory using a fiber-optic fluorosensor that consisted of a nitrogen laser and an optical multi-channel analyzer system.

Keywords: FLUORESCENCE; FUNGAL GROWTH; LIDAR; POLYMERIC INSULATORS; REMOTE SENSING

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702054615214

Affiliations: 1: Department of Physics, Lund Institute of Technology, P.O. Box 118, SE-221 00, Lund, Sweden 2: Department of Fiber and Polymer Technology, The Royal Institute of Technology, SE-100 44 Stockholm, Sweden 3: Department of Physics, Lund Institute of Technology, P.O. Box 118, SE-221 00, Lund, Sweden; Laser & Fiber Optics Centre, Department of Physics, University of Cape Coast, Cape Coast, Ghana 4: Weapons and Protection Division, FOI-Swedish Defense Research Agency, SE-147 25 Tumba, Sweden

Publication date: August 1, 2005

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