Monitoring of a Pharmaceutical Nanomilling Process Using Grating Light Reflection Spectroscopy
Authors: Hamad, Mazen L.; Kailasam, Srividya; Brodsky, Anatol M.; Han, Ronald; Higgins, John P.; Thomas, Denise; Reed, Robert A.; Burgess, Lloyd W.
Source: Applied Spectroscopy, Volume 59, Issue 1, Pages 9A-24A and 1-143 (January 2005) , pp. 16-25(10)
Publisher: Society for Applied Spectroscopy
Abstract:
An optical diagnostic method, grating light reflection spectroscopy (GLRS), has been demonstrated for the in situ monitoring of properties of heterogeneous matrices in industrial processes. The technique is based on measurements near the critical points of intensity and phase in waves reflected from a transmission diffraction grating in contact with a diagnostic sample. The features contained in the reflection spectrum near these thresholds allow for the simultaneous determination of the real and imaginary parts of the dielectric function of the sample. Using these data, the milling progress of highly concentrated fluid suspensions is observed as the material is milled from approximately 40 mm to 160 nm in diameter. A theoretical model that closely resembles experimentally determined spectra was constructed and applied in combination with principal components analysis (PCA) to demonstrate that GLRS can be used to closely monitor changes in the mean particle size of the nanomilled drug product.Document Type: Research article
DOI: http://dx.doi.org/10.1366/0003702052940521
Affiliations: 1: Center for Process Analytical Chemistry, Department of Chemistry, University of Washington, Seattle, Washington
Publication date: 2005-01-01
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
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- By this author: Hamad, Mazen L. ; Kailasam, Srividya ; Brodsky, Anatol M. ; Han, Ronald ; Higgins, John P. ; Thomas, Denise ; Reed, Robert A. ; Burgess, Lloyd W.

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