If you are experiencing problems downloading PDF or HTML fulltext, our helpdesk recommend clearing your browser cache and trying again. If you need help in clearing your cache, please click here . Still need help? Email help@ingentaconnect.com

Microchip Laser-Induced Breakdown Spectroscopy: A Preliminary Feasibility Investigation

$29.00 plus tax (Refund Policy)

Buy Article:

Abstract:

A commercial, 7 μJ/pulse, 550 ps microchip laser is used to induce plasma on Pb, Si, Cu, Fe, Ni, Ti, Zn, Ta, and Mo foils and a Si wafer. The measured plasma lifetime is comparable with the duration of the laser pulse (a few ns). The plasma continuum radiation is low, while some of the strong resonance lines (e.g., Zn 213.86 nm) show self-reversal. Quantitative analysis is possible using non-gated detectors but analytical lines should be chosen with care to avoid reduction in the linear dynamic range. The mass removed (0.5–20 ng/pulse) is sufficient to yield spectra that are detectable with portable grating spectrometers equipped with non-gated, non-intensified detector arrays. The spectrum of Cd is detected with a broadband portable spectrometer (200–950 nm). The combination of the broadband spectrometer and the microchip laser is very promising for material identification, especially in field applications.

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702041389427

Affiliations: Department of Chemistry, University of Florida, Gainesville, Florida 32611

Publication date: July 1, 2004

More about this publication?
Related content

Tools

Favourites

Share Content

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more