Infrared Absorption Enhancement of C₆₀ by Overlaying Thin Silver Island Films

Authors: Wadayama, T.; Aoshima, K.; Kawano, S.; Hatta, A.

Source: Applied Spectroscopy, Volume 58, Issue 3, Pages 74A-86A and 257-354 (March 2004) , pp. 299-303(5)

Publisher: Society for Applied Spectroscopy

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Abstract:

Normal-incidence infrared absorption has been observed for silver overlaid C₆₀ thin films formed on surface-oxidized Si(111) substrates as a function of the silver or C₆₀ film thickness. The absorption spectra exhibit bands at 1429 and 1180 cm^-1 due, respectively, to the infrared active T_lu (4) and T_lu (3) modes of C₆₀ in multi-layers. Additionally, two bands appear at 1442 and 1370 cm^-1. The former band is caused by activation of the infrared inactive (Raman active) A_g (2) mode via electron transfer from the silver to adsorbed C₆₀, and the latter is assigned to the T_1u (4) mode red-shifted by the charge transfer. These bands are all enhanced in intensity dependent either upon the silver or C₆₀ thickness, i.e., the largest absorption enhancement is obtained for 25-monolayers-thick silver and 12-nm-thick C₆₀. Under atomic force microprobe inspection, the average size and height of the islands in the overlaid 25-monolayers-thick silver change with underlying C₆₀ film thickness. The influence of the C₆₀ film structure upon the silver film and in turn the absorption intensity is strongly suggested.

Keywords: C60; SILVER; SURFACE-ENHANCED INFRARED ABSORPTION; ATOMIC FORCE MICROSCOPY; AFM

Document Type: Research article

DOI: http://dx.doi.org/10.1366/000370204322886645

Affiliations: 1: Department of Materials Science, Graduate School of Engineering, Tohoku University, Aobayama 02, Sendai 980-8579, Japan

Publication date: 2004-03-01

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