Effect on Noise of Intensity-Axis Correction of Spectra Recorded with Charge-Coupled Device Detectors
Abstract:We have examined the effect of intensity-axis correction on noise in white light spectra recorded with charge-coupled device (CCD) detectors. Measurements were made with five detectors in Raman spectrometers. Detectors were both liquid-nitrogen and thermoelectrically cooled devices and one room temperature device. Both random and pattern noise have been considered. We used cross-correlation of noise sets to provide an indicator of a fixed pattern in the spectra and an assessment of the efficacy of the correction procedure in removing this pattern. For four of the five detectors intensity-axis correction provided a significant improvement in signal-to-noise ratio. Correction was particularly important for measurements made with lower-cost CCD detectors of the kind proposed for process control instruments.
Document Type: Research Article
Publication date: May 1, 2002
More about this publication?
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
- Editorial Board
- Information for Authors
- Submit a Paper
- Subscribe to this Title
- Membership Information
- Request copyrighted SAS materials
- Spectroscopic Nomenclature
- Focal Point (Open Access)
- ingentaconnect is not responsible for the content or availability of external websites