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The merits of a polymer characterization technique, near edge X-ray absorption fine structure (NEXAFS) spectromicroscopy, are demonstrated through the characterization of a multilayer polymer film with
partially unknown chemical composition. The combination of chemical speciation through NEXAFS spectroscopy with the high spatial resolution available in X-ray microscopy allows the characterization of polymeric
materials not possible with conventional techniques. Analysis of a multilayer with layers as thin as 4 μm has yielded results that differ from those previously obtained by infrared microscopy. Layers
below the spatial resolution limit of infrared microscopy were characterized.
The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)