Authors: Tam, Simon; Fajardo, Mario E.

Source: Applied Spectroscopy, Volume 55, Issue 12, Pages 388A-408A and 1573-1733 (December 2001) , pp. 1634-1644(11)

Publisher: Society for Applied Spectroscopy

Abstract:

We present a convenient method for determining the thickness of a cryogenic parahydrogen (pH₂) solid from its infrared (IR) absorption spectrum. Millimeters-thick pH₂ solids of exceptional optical clarity can be produced by the rapid vapor deposition method [M.E. Fajardo and S. Tam, J. Chem. Phys. 108, 4237 (1998)]. Doping of these pH₂ solids is readily accomplished by co-deposition of the desired impurities, making them excellent hosts for high-resolution matrix isolation spectroscopy. The intensities of the IR "double" transitions Q₁(0) + S₀(0) and S₁(0) + S₀(0) of the pH₂ host are insensitive to the matrix microstructure and to the presence of dopants, so these absorptions are especially well suited for thickness determinations. We calibrate the integrated absorption intensities of these two bands against the sample thicknesses determined from transmission interference fringes appearing in the same experimental spectra; we report: αtilde[Q₁(0) + S₀(0)] = 4.84(±0.18) × 10^-14 cm³/s, and αtilde[S₁(0) + S₀(0)] = 0.35(±0.02) × 10^-14 cm³/s (95% confidence). We also discuss several other advantages of rapid-vapor-deposited pH₂ solids as hosts for quantitative IR absorption spectroscopy of dopant species.

Keywords: MATRIX ISOLATION SPECTROSCOPY

Document Type: Research article

DOI: http://dx.doi.org/10.1366/0003702011953946

Publication date: 2001-12-01

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