We report on the development of a simple, rugged fiber-optic probe for process Raman measurements, in which laser line rejection is based on an absorptive longpass filter made from a direct bandgap CdTe
semiconductor. The probe can be used with a fixed wavelength laser at 830 nm, and Raman spectra can be recorded down to 200 cm-1 from the laser line. The filter thickness can be adjusted for
final turning of the filter edge, as the edge slope is almost independent of thickness in the range 0.1 to 1 mm. Other properties of the probe, such as its signal-to-noise ratio and signal-to-background
ratio, are shown to compare well with those of a state-of-the-art probe based on holographic notch filter techniques.
The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)