Authors: Ekgasit, Sanong; Siesler, Heinz W.; Steeman, Paul A.M.

Source: Applied Spectroscopy, Volume 53, Issue 12, Pages 460A-474A and 1485-1655 (December 1999) , pp. 1535-1541(7)

Publisher: Society for Applied Spectroscopy

Abstract:

A technique using rapid-scan Fourier transform infrared (FT-IR) spectroscopy to observe reversible dynamic changes of systems under an externally applied perturbation is introduced. The technique does not require a lock-in amplifier or synchronization between the applied perturbation and the spectral acquisition. With the use of a carefully designed sampling rate with respect to the perturbation period and reconstruction of the observed spectral intensities, dynamic spectral intensities of the system are obtained. Due to the repeated behavior, the reconstructed spectral intensities can be used to represent the dynamic characteristic of the system. The experimentation time of the rapid-scan technique is significantly shorter than that of the step-scan technique. The influences of noise and experimental parameters on the observed spectral intensities are verified. Applications of the technique to systems with sinusoidal dynamic changes and exponentially decaying dynamic changes are demonstrated.

Keywords: FOURIER TRANSFORM INFRARED SPECTROSCOPY; FT-IR SPECTROSCOPY; DYNAMIC INFRARED SPECTROSCOPY; RAPID-SCAN TECHNIQUE; STEP-SCAN TECHNIQUE

Document Type: Research article

DOI: http://dx.doi.org/10.1366/0003702991946271

Publication date: 1999-12-01

More about this publication?

• The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge.
  
  Previously published as Bulletin (Society for Applied Spectroscopy)
• Editorial Board
• Information for Authors
• Submit a Paper
• Subscribe to this Title
• Membership Information
• Request copyrighted SAS materials
• Spectroscopic Nomenclature
• Focus Compendium
• ingentaconnect is not responsible for the content or availability of external websites

Related content

• In this: publication
• By this: publisher
• In this Subject: Analytical Chemistry
• By this author: Ekgasit, Sanong ;  Siesler, Heinz W. ;  Steeman, Paul A.M.

Website © Publishing Technology. Article copyright remains with the publisher, society or author(s) as specified within the article.

• Terms and conditions
• Privacy policy
• Information for advertisers