Attenuated Total Internal Reflection Microspectroscopy of Isolated Particles: An Alternative Approach to Current Methods

Authors: Lewis, Lori; Sommer, Andre J.

Source: Applied Spectroscopy, Volume 53, Issue 4, Pages 144A-171A and 375-488 (April 1999) , pp. 375-380(6)

Publisher: Society for Applied Spectroscopy

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An alternative approach to conduct attenuated total internal reflection infrared microspectroscopy is described with the use of cartridge-based hemispherical internal reflection elements. The study demonstrates that the devices can be employed on any infrared microscope having reflectance capabilities. A comparison shows that the method provides the same signal-to-noise ratio in comparison to transmission studies for equal sample sizes. In addition, a 4 X decrease in the sampled areas inherent with the method was verified for samples 60 mu m in diameter and larger. Examples are presented that demonstrate the method's capability of studying small isolated samples without the use of a contaminating mounting media. Examples are also presented that demonstrate the potential to study samples without the effects of diffraction.


Document Type: Research Article


Publication date: April 1, 1999

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