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The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge.

Previously published as Bulletin (Society for Applied Spectroscopy)

Applied Spectroscopy was previously published as Bulletin (Society for Applied Spectroscopy).

Publisher: Society for Applied Spectroscopy

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Volume 52, Issue 10, Pages 374A-390A and 1257-1367 (October 1998)

Investigation of the Subcellular Localization of Zinc Phthalocyanines by Raman Mapping
pp. 1257-1263(7)
Authors: Freeman, T. L.; Cope, S. E.; Stringer, M. R.; Cruse-Sawyer, J. E.; Brown, S. B.; Batchelder, D. N.; Birbeck, K.

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Hyperspectral Raman Line Imaging of Syndiotactic Polystyrene Crystallinity
pp. 1264-1268(5)
Authors: Zhang, Shuliang L.; Pezzuti, Jerilyn A.; Morris, Michael D.; Appadwedula, Aruna; Hsiung, Chang-Meng; Leugers, M. Anne; Bank, David

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Imaging of Semicrystalline Polymers and Polymer Blends by FT-IR Microspectroscopy
pp. 1269-1273(5)
Authors: Kressler, Jorg; Schafer, Rudiger; Thomann, Ralf

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Raman Spectroscopy of the Kaolinite Hydroxyls at 77 K
pp. 1277-1282(6)
Authors: Johansson, Ursula; Frost, Ray L.; Forsling, Willis; Kloprogge, J. Theo

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Field Test of a Novel Microlaser-Based Probe for in Situ Fluorescence Sensing of Soil Contamination
pp. 1299-1304(6)
Authors: Bloch, Jonathan; Johnson, Bernadette; Newbury, Nathan; Germaine, Jack; Hemond, Harry; Sinfield, Joe

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Spectroscopic Studies of Indigo Carmine Dye in Organized Media
pp. 1305-1313(9)
Authors: Roberts, Eric L.; Burguieres, Sarah; Warner, Isiah M.

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Luminescence Lifetime Quenching of a Ruthenium(II) Polypyridyl Dye for Optical Sensing of Carbon Dioxide
pp. 1314-1320(7)
Authors: Marazuela, Maria D.; Moreno-Bondi, Maria C.; Orellana, Guillermo

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Matrix-Enhanced Calibration Procedure for Multivariate Calibration Models with Near-Infrared Spectra
pp. 1339-1347(9)
Authors: Riley, Mark R.; Arnold, Mark A.; Murhammer, David W.

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Detecting and Identifying Spectral Anomalies Using Wavelet Processing
pp. 1348-1352(5)
Authors: Stork, Chris L.; Veltkamp, David J.; Kowalski, Bruce R.

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NOTES
pp. 1353-1363(11)

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SPECTROSCOPIC TECHNIQUES
pp. 1364-1367(4)

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SOCIETY FOR APPLIED SPECTROSCOPY Guest Editorial
pp. 374A-374A(1)
Author: Olesik, John

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Applied Spectroscopy News
pp. 387A-388A(2)
Author: Bradshaw, Deborah K.

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Employment Opportunities
pp. 389A-390A(2)

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Spectroscopists' Calendar
pp. 376A-376A(1)
Author: Green, Robert B.

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