The feasibility of simultaneous measurement of important components such as o-xylene, m-xylene, p-xylene, ethylbenzene, toluene, aliphatic hydrocarbons, and total C9-C10 aromatic hydrocarbons in the p -xylene
production process is investigated. Mixtures of those components were prepared to simulate concentration levels in actual p-xylene processes, and near-infrared (NIR) spectra were collected from mixtures
over the spectral range of 1100 to 2500 nm. Even with the very similar spectral features of xylene isomers and other aromatic compounds, the concentrations of each of the components in the mixtures are
accurately predicted by using a partial least-squares (PLS) algorithm and show excellent correlation with conventional gas chromatographic analysis. The results clearly demonstrate the possibility of using
NIR spectroscopy for monitoring the major components in an actual p-xylene production process for process control and optimization.
The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)