TO-LO Splitting in Infrared Spectra of Thin Films
Abstract:The importance of transverse optic-longitudinal optic (TO-LO) splitting in the interpretation of infrared spectra of thin films is experimentally presented. When infrared spectra are observed at oblique angles of incidence, the shifts in peak position and/or the changes in peak shape may be due to TO-LO splitting. Before one assigns the optical behavior to surface phenomena such as molecular orientation, proper care must be employed. The proposed technique includes optical calculation to extract surface phenomena from TO-LO splitting in the spectra, and it is applied to reflection absorption spectra of perfluoropolyether.
Document Type: Research Article
Affiliations: Research Center, Asahi Glass Company, Ltd., 1150 Hazawa, Kanagawa-ku, Yokohama 221, Japan
Publication date: June 1, 1996
More about this publication?
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
- Editorial Board
- Information for Authors
- Submit a Paper
- Subscribe to this Title
- Membership Information
- Request copyrighted SAS materials
- Spectroscopic Nomenclature
- Focal Point (Open Access)
- ingentaconnect is not responsible for the content or availability of external websites