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TO-LO Splitting in Infrared Spectra of Thin Films

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Abstract:

The importance of transverse optic-longitudinal optic (TO-LO) splitting in the interpretation of infrared spectra of thin films is experimentally presented. When infrared spectra are observed at oblique angles of incidence, the shifts in peak position and/or the changes in peak shape may be due to TO-LO splitting. Before one assigns the optical behavior to surface phenomena such as molecular orientation, proper care must be employed. The proposed technique includes optical calculation to extract surface phenomena from TO-LO splitting in the spectra, and it is applied to reflection absorption spectra of perfluoropolyether.

Keywords: Optical calculation; Perfluoropolyether; TO-LO splitting; a-SiNx

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702963905709

Affiliations: Research Center, Asahi Glass Company, Ltd., 1150 Hazawa, Kanagawa-ku, Yokohama 221, Japan

Publication date: June 1, 1996

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