Authors: Shelley, Paul H.; Booksh, Karl S.; Burgess, Lloyd W.; Kowalski, Bruce R.

Source: Applied Spectroscopy, Volume 50, Issue 1, Pages 1-130 (January 1996) , pp. 119-125(7)

Publisher: Society for Applied Spectroscopy

Abstract:

A fiber-optic-based optical low coherence reflectometer (OLCR) is used to measure the thickness of polyester films. The measurements are made on both stationary and moving films to show the feasibility of this technique in a process environment. Autocorrelation is used to extract useful data from raw reflectometry data, and a statistical analysis of the data from both moving and stationary films is done to help demonstrate the application of this method. Although the reflectometer is not optimally configured for process analysis, a reliable estimate of polymer film thickness is shown in less than one minute measurement time for the moving films.

Keywords: Polymer film thickness; Interferometry; Autocorrelation; Fiber-optic sensor; Optical low coherence refiectometry (OLCR)

Document Type: Research article

DOI: http://dx.doi.org/10.1366/0003702963906771

Affiliations: 1: Center for Process Analytical Chemistry, Department of Chemistry, Mail Stop BG-10, University of Washington, Seattle, Washington 98195

Publication date: 1996-01-01

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