Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part I: Principle and Feasibility

Authors: Soudier, Luc; Mermet, Jean-Michel

Source: Applied Spectroscopy, Volume 49, Issue 10, Pages 12A-18A and 1381-1542 (October 1995) , pp. 1478-1484(7)

Publisher: Society for Applied Spectroscopy

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Abstract:

A procedure is described to conduct qualitative analysis in inductively coupled plasma atomic emission spectrometry even in the presence of spectral interferences. This procedure is based on the use of both line correlation and normalized relative line intensities of given elements. When spectral interferences due to a major element are observed for an analyte, use of multiple linear regression of the normalized relative line intensities of both the analyte and the major element provides information about the certainty of the presence of the analyte and the relative concentration between the major element and the analyte. Direct peaking and automatic background correction are required for this procedure. In this instance, no information is necessary about the shape of the line profile. This procedure has been tested with an echelle grating-based dispersive system equipped with a custom segmented-array charge-coupled device detector.

Keywords: Emission spectrometry; Inductively coupled plasma; Multiple linear regression; Normalized line intensity ratio; Qualitative analysis

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702953965623

Affiliations: Laboratoire des Sciences Analytiques (URA CNRS 435), Bat. 308, Université Claude Bernard-Lyon I, 69622 Villeurbanne Cedex, France

Publication date: October 1, 1995

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