The behavior of a planar magnetron glow discharge used as a sampling device and ion source for mass spectrometry of conducting solids is examined. Low-pressure operation of the magnetron allows efficient sputtering and ion production from conducting samples. Interfacing the magnetron
with the mass spectrometer is simplified by low-pressure magnetron operation. A special sample holder allows up to five sample plugs to be analyzed without the source chamber vacuum being broken. Sample ion current is not found to be a simple function of discharge current, but is a strong
function of sample axial position relative to the mass spectrometer sampling cone. The mass spectrometer sampling cone orifice diameter may be varied from 0.5 to 5.0 mm. A cone orifice diameter of 2.0 mm yields optimum analytical conditions. Determination of Al at the 3-5% level in a series
of NIST Zn-base alloy standards yields a straight-line analytical curve, suggesting the potential application of the device to high-precision analyses of alloys.
Department of Chemistry, University of Michigan, Ann Arbor, Michigan 48109 2:
Department of Chemistry, Eastern Michigan University, Ypsilanti, Michigan 48197
Publication date: September 1, 1995
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The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)